| 引用本文: | 陈涛,宋友桂,曾蒙秀,李新新.2013.影响XRD衍射谱形态的实验条件分析[J].地球环境学报,(2):1249-1254 |
| CHEN Tao,SONG You-gui,ZENG Meng-xiu,Li Xin-xin.2013.Analysis on the experimental conditions affecting the shape of the XRD spectrum[J].Journal of Earth Environment,(2):1249-1254 |
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| 摘要: |
| X射线衍射（XRD）谱形态决定了样品的物相种类和含量，是定性与定量分析的基础，本文分析了各种实验条件如样品粒径、装样方式、表面平整度、扫描速率、X射线管功率、发散狭缝宽度对湖泊沉积物和黄土样品衍射谱形态的影响，同时初步讨论了XRD定量分析的影响因子。结果表明，样品过250目筛，采用横式填样方式，保持样品表面尽可能平整， 选取2°·min-1的扫描速度，控制X射线管功率为1.6 kW，选取2°的发散狭缝宽度均有利于获得较理想的衍射谱。择优取向、晶体吸收和不同的计算方法对XRD定量分析均有不同程度的影响。 |
| 关键词: 衍射强度 粒度 扫描速度 发散狭缝 |
| DOI：10.7515/JEE201302002 |
| CSTR：32259.14.JEE201302002 |
| 分类号:O722 |
基金项目:国家自然科学基金(41290253, 41172166)；中国科学院重点部署项目(KZZD-EW-04-02)
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| 英文基金项目: |
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| Analysis on the experimental conditions affecting the shape of the XRD spectrum |
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CHEN Tao1,2,SONG You-gui1,ZENG Meng-xiu1,3,Li Xin-xin1,2
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1.State Key Laboratory of Loess and Quaternary Geology, Institute of Earth Environment, Chinese Academy of Sciences, Xi′an 710075, China; 2.University of the Chinese Academy of Sciences，Beijing 100049, China; 3.School of Geographic and Oceanographic Sciences, Nanjing University, Nanjing 210093, China
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| Abstract: |
| Determining the type and content of the phases in the samples, X-ray diffraction (XRD) spectrum morphology is the basic analysis of the qualitative and quantitative. This paper analyses various experimental conditions such as sample particle size, filling mode, the flatness of the surface of the sample, scanning rate, power of X-ray tube, divergence slit width，which affect the morphology of spectrum about the lacustrine sediments and loess. The results show that keeping the particle size of 250 mesh sieve, using a horizontal type of filling mode, maintaining the sample surface as flat as possible, selecting the scanning speed at 2°·min-1, controlling the power of the X-ray tube about 1.6 kW, selecting divergence slit width as 2° are conducive to obtain better diffraction spectrum. Preferred orientation, crystal absorption and different methods of calculation have different influences on the quantitative analysis of X-ray diffraction. |
| Key words: diffraction intensity particle size scanning speed divergence slit width |
